Basic info
Industry
semiconductor manufacturing
Sectors
Metal organic chemical vapor deposition
Semiconductor
Customer Service
Glass breakage detection
Electronics
bow
Thin-film metrology
Wafer curvature
Physical vapor deposition
Industrial Metrology
Manufacturing
Wafer Carrier Measurement
Film deposition rate
Photovoltaics
Molecular Beam Epitaxy (MBE)
MOCVD Process
Glass defect inspection
Thin-Film Monitoring and Control
Thin-Film Stress and Strain
RHEED Analysis
Solar panel inspection
Ex Situ Metrology
tilt measurement
In Situ Metrology
Optical Metrology
Date founded
1992