Basic info
Industry
semiconductor manufacturing
Sectors
Semiconductor
Metal organic chemical vapor deposition
tilt measurement
Glass defect inspection
Ex Situ Metrology
Physical vapor deposition
Wafer curvature
RHEED Analysis
In Situ Metrology
Thin-Film Stress and Strain
Photovoltaics
Thin-film metrology
Manufacturing
Wafer Carrier Measurement
MOCVD Process
Electronics
Optical Metrology
bow
Customer Service
Molecular Beam Epitaxy (MBE)
Glass breakage detection
Film deposition rate
Solar panel inspection
Thin-Film Monitoring and Control
Industrial Metrology
Date founded
1992