Basic info
Industry
semiconductor manufacturing
Sectors
Semiconductor industry aimed solutions
In-line non-destructive inspection and metrology
Energy-Dispersive X-Ray Fluorescence (ED-XRF)
Semiconductor
300 mm wafers
Unique analytical solutions
Automated 3D Vision
3D scanner for In-line non-destructive inspection and metrology.
OPTICAL TOOLS: Hybrid wafer metrology combining micro-spot ED-XRF and 2D microscope
Advanced Packaging
Hybrid Metrology
Wafer Metrology and Inspection
Manufacturing
Date founded
2012