Basic info
Industry
semiconductor manufacturing
Sectors
Semiconductor industry aimed solutions
Semiconductor
Wafer Metrology and Inspection
300 mm wafers
Automated 3D Vision
OPTICAL TOOLS: Hybrid wafer metrology combining micro-spot ED-XRF and 2D microscope
3D scanner for In-line non-destructive inspection and metrology.
Hybrid Metrology
Unique analytical solutions
Energy-Dispersive X-Ray Fluorescence (ED-XRF)
Advanced Packaging
Manufacturing
In-line non-destructive inspection and metrology
Date founded
2012